Read more http://www.eurekalert.org/pub_releases/2011-05/nios-nm052511.php
Wednesday, 25 May 2011 05:00
NIST 'nanowire' measurements could improve computer memory
Recent NIST measurements may have revealed the optimal characteristics for a new type of highly efficient computer memory now under development -- nanowire-based charge-trapping memory devices.
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Psychology News
